DISEASE: Bacterial scab
HOST: Beet
Bacterial scab of table beet.
Bacterial scab | Beet
DISEASE: Bacterial scab
HOST: Beet (Beta vulgaris var. conditiva)
PATHOGEN: Pantoea agglomerans pv. betae
SOURCE: T. Burr
DISEASE: Bacterial scab
HOST: Gladiolus
Gladiolus bulb with brownish to dark brown, sunken scabs.
Bacterial scab | Gladiolus
DISEASE: Bacterial scab
HOST: Gladiolus (Gladiolus sp.)
PATHOGEN: Burkholderia gladioli pv. gladioli
PATHOGEN SYNONYM: Pseudomonas gladioli pv. gladioli
SOURCE: Plant Protection Service of the Netherlands
DISEASE: Larkspur virescence
HOST: Larkspur
Two diseased plants with stunted and small leaves, lack of flower coloration, and bunched flower buds. Healthy plant (left).
Larkspur virescence | Larkspur
DISEASE: Larkspur virescence
HOST: Larkspur (Delphinium sp.)
PATHOGEN: 'Candidatus Phytoplasma asteris'
PATHOGEN SYNONYM: Phytoplasma Aster yellows group
SOURCE: R. Raabe
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Seedling with rot symptoms.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Diseased, unhulled grains with brown discoloration. Healthy grain (left).
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto