DISEASE: Almond leaf scorch
HOST: Almond
Light brown necrotic (scorched) areas on curling leaves.
Almond leaf scorch | Almond
DISEASE: Almond leaf scorch
HOST: Almond (Prunus dulcis)
PATHOGEN: Xylella fastidiosa
SOURCE: W. Sinclair
DISEASE: Almond leaf scorch
HOST: Almond
Dying almond trees with scorched appearance. Initial symptoms are marginal chlorosis, usually late in the year. Scorch often is first noted at leaf tips, symptoms worsen, and terminal branches may die.
Almond leaf scorch | Almond
DISEASE: Almond leaf scorch
HOST: Almond (Prunus dulcis)
PATHOGEN: Xylella fastidiosa
SOURCE: R. Davis, M. Davis
DISEASE: Bacterial pocket
HOST: Beet
Sugar beets with many small tubercles at infection sites.
Bacterial pocket | Beet
DISEASE: Bacterial pocket
HOST: Beet (Beta vulgaris)
PATHOGEN: Xanthomonas axonopodis pv. betlicola
PATHOGEN SYNONYM: Xanthomonas campestris pv. betlicola
SOURCE: C. Schneider
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Seedling with rot symptoms.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Diseased, unhulled grains with brown discoloration. Healthy grain (left).
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto