DISEASE: Larkspur virescence
HOST: Larkspur
Two diseased plants with stunted and small leaves, lack of flower coloration, and bunched flower buds. Healthy plant (left).

Larkspur virescence | Larkspur
DISEASE: Larkspur virescence
HOST: Larkspur (Delphinium sp.)
PATHOGEN: 'Candidatus Phytoplasma asteris'
PATHOGEN SYNONYM: Phytoplasma Aster yellows group
SOURCE: R. Raabe
DISEASE: Oleander leaf scorch
HOST: Oleander
Diseased plant with scalloped, yellowish leaves. This usually is followed by dieback of twigs and branches. Plants often die 2 years after infection.

Oleander leaf scorch | Oleander
DISEASE: Oleander leaf scorch
HOST: Oleander (Nerium oleander)
PATHOGEN: Xylella fastidiosa
SOURCE: S. Purcell
DISEASE: Oleander leaf scorch
HOST: Oleander
Oleander with symptoms of severe scorch.

Oleander leaf scorch | Oleander
DISEASE: Oleander leaf scorch
HOST: Oleander (Nerium oleander)
PATHOGEN: Xylella fastidiosa
SOURCE: M. Blua
DISEASE: Oleander leaf scorch
HOST: Oleander
Oleander with scorch symptoms primarily at leaf tips, an early stage of disease.

Oleander leaf scorch | Oleander
DISEASE: Oleander leaf scorch
HOST: Oleander (Nerium oleander)
PATHOGEN: Xylella fastidiosa
SOURCE: M. Blua
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Seedling with rot symptoms.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto