DISEASE: Marginal leaf blight
HOST: Lettuce
Marginal leaf blight first appears as slimy wilting of leaf margins. Small, reddish lesions may be seen on leaf blades. Infected tissues turn brown to black in time.
Marginal leaf blight | Lettuce
DISEASE: Marginal leaf blight
HOST: Lettuce (Lactuca sativa)
PATHOGEN: Pseudomonas marginalis
SOURCE: L. Fucikovsky
DISEASE: Periwinkle wilt
HOST: Periwinkle
Infected plants with stunting and sparse foliage (center and right).
Periwinkle wilt | Periwinkle
DISEASE: Periwinkle wilt
HOST: Periwinkle (Vinca sp.)
PATHOGEN: Xylella fastidiosa
SOURCE: R. McCoy, M. Davis
DISEASE: Periwinkle wilt
HOST: Periwinkle
Draeculacephala minerva, leafhopper vector of Xylella fastidiosa on plants such as periwinkle and watercress.
Periwinkle wilt | Periwinkle
DISEASE: Periwinkle wilt
HOST: Periwinkle (Vinca sp.)
PATHOGEN: Xylella fastidiosa
SOURCE: J. Clark, A. Purcell, M. Davis
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Seedling with rot symptoms.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Diseased, unhulled grains with brown discoloration. Healthy grain (left).
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto