DISEASE: Bacterial leaf scorch
HOST: Pecan
Pecan with necrotic scorched leaves with distinct dark lines between healthy and diseased tissues.

Bacterial leaf scorch | Pecan
DISEASE: Bacterial leaf scorch
HOST: Pecan (Carya illinoinensis)
PATHOGEN: Xylella fastidiosa
SOURCE: T. Brenneman
DISEASE: Bacterial leaf scorch
HOST: Sycamore
Sycamore with scorched leaves and dieback of small branches.

Bacterial leaf scorch | Sycamore
DISEASE: Bacterial leaf scorch
HOST: Sycamore (Platanus occidentalis)
PATHOGEN: Xylella fastidiosa
SOURCE: W. Sinclair
DISEASE: Bacterial leaf scorch
HOST: Sycamore
Close-up of scorched leaves.

Bacterial leaf scorch | Sycamore
DISEASE: Bacterial leaf scorch
HOST: Sycamore (Platanus occidentalis)
PATHOGEN: Xylella fastidiosa
SOURCE: W. Sinclair
DISEASE: Bacterial stem and root rot
HOST: Sweet potato
Collapse of stems and roots caused by systemic activity of the pathogen.

Bacterial stem and root rot | Sweet potato
DISEASE: Bacterial stem and root rot
HOST: Sweet potato (Ipomoea batatas)
PATHOGEN: Dickeya sp.
PATHOGEN SYNONYM: Erwinia chrysanthemi
SOURCE: N. Schaad
DISEASE: Bacterial stem and root rot
HOST: Sweet potato
Rot and collapse of stem, petioles, and leaves caused by systemic infection.

Bacterial stem and root rot | Sweet potato
DISEASE: Bacterial stem and root rot
HOST: Sweet potato (Ipomoea batatas)
PATHOGEN: Dickeya sp.
PATHOGEN SYNONYM: Erwinia chrysanthemi
SOURCE: N. Schaad
DISEASE: Bacterial stem and root rot
HOST: Sweet potato
Rot and internal discoloration of tuber.

Bacterial stem and root rot | Sweet potato
DISEASE: Bacterial stem and root rot
HOST: Sweet potato (Ipomoea batatas)
PATHOGEN: Dickeya sp.
PATHOGEN SYNONYM: Erwinia chrysanthemi
SOURCE: C. Clark
DISEASE: Bacterial wilt and dieback
HOST: Willow
Cross sections of the characteristic "watermark stain" of diseased wood. Wilt and dieback occur as disease progresses.

Bacterial wilt and dieback | Willow
DISEASE: Bacterial wilt and dieback
HOST: Willow (Salix sp.)
PATHOGEN: Brenneria salicis
PATHOGEN SYNONYM: Erwinia salicis
SOURCE: Y. Sakamoto, M. Goto