DISEASE: Bacterial pustule
HOST: Soybean
Early symptoms are minute, pale green spots on young leaves. Later, small pustules form in the center of spots, best observed on underside of leaves. Spots vary in size and darken with age and lesions coalesce. Dead areas are torn away by wind.

Bacterial pustule | Soybean
DISEASE: Bacterial pustule
HOST: Soybean (Glycine max)
PATHOGEN: Xanthomonas axonopodis pv. glycines
PATHOGEN SYNONYM: Xanthomonas campestris pv. glycines
SOURCE: APS
DISEASE: Hollow stalk
HOST: Tobacco
Hollow stalk may appear at time of topping and suckering. Top leaves wilt and the stalk becomes bare as the disease moves downward.

Hollow stalk | Tobacco
DISEASE: Hollow stalk
HOST: Tobacco (Nicotiana tabacum)
PATHOGEN: Pectobacterium carotovorum
PATHOGEN SYNONYM: Erwinia carotovora subsp. carotovora
SOURCE: P. Shoemaker
DISEASE: Hollow stalk
HOST: Tobacco
Infection of flue-cured tobacco stalks occur at wound sites caused by topping. After top infection, browning of pith occurs and tissues rot.

Hollow stalk | Tobacco
DISEASE: Hollow stalk
HOST: Tobacco (Nicotiana tabacum)
PATHOGEN: Pectobacterium carotovorum
PATHOGEN SYNONYM: Erwinia carotovora subsp. carotovora
SOURCE: APS
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Seedling with rot symptoms.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto