DISEASE: Aster yellows
HOST: Squash
Diagnostic characteristics for the disease are yellowing of young leaves, proliferation of secondary shoots, and rigid erect habit. Leaves are misshapen and smaller than normal and have stiff, thick laminae.

Aster yellows | Squash
DISEASE: Aster yellows
HOST: Squash (Cucurbita sp.)
PATHOGEN: 'Candidatus Phytoplasma asteris'
PATHOGEN SYNONYM: Phytoplasma Aster yellows group
SOURCE: S. Miller
DISEASE: Bacterial leaf spot
HOST: Cabbage
Necrotic, light tan leaf spots, a late stage in disease development.

Bacterial leaf spot | Cabbage
DISEASE: Bacterial leaf spot
HOST: Cabbage (Brassica pekinensis)
PATHOGEN: Xanthomonas campestris pv. armoraciae
SOURCE: R. Campbell
DISEASE: Bacterial spot
HOST: Plum
Shot-hole phase of disease.

Bacterial spot | Plum
DISEASE: Bacterial spot
HOST: Plum (Prunus domestica)
PATHOGEN: Xanthomonas arboricola pv. pruni
PATHOGEN SYNONYM: Xanthomonas campestris pv. pruni
SOURCE: T. Burr
DISEASE: Bacterial spot
HOST: Plum
Dark, sunken area on blossom end of fruit.

Bacterial spot | Plum
DISEASE: Bacterial spot
HOST: Plum (Prunus domestica)
PATHOGEN: Xanthomonas arboricola pv. pruni
PATHOGEN SYNONYM: Xanthomonas campestris pv. pruni
SOURCE: S. Thomson
DISEASE: Bacterial spot
HOST: Plum
Dark brown necrotic lesions along main leaf vein. Lesions may drop off, leaving shot-hole effect.

Bacterial spot | Plum
DISEASE: Bacterial spot
HOST: Plum (Prunus domestica)
PATHOGEN: Xanthomonas arboricola pv. pruni
PATHOGEN SYNONYM: Xanthomonas campestris pv. pruni
SOURCE: S. Thomson
DISEASE: Basal rot
HOST: Cabbage
Severe basal rot of Chinese cabbage.

Basal rot | Cabbage
DISEASE: Basal rot
HOST: Cabbage (Brassica pekinensis)
PATHOGEN: Pectobacterium carotovorum
PATHOGEN SYNONYM: Erwinia carotovora subsp. carotovora
SOURCE: Y. Sakamoto, M. Goto
DISEASE: Basal rot
HOST: Cabbage
Chinese cabbage with rotted base.

Basal rot | Cabbage
DISEASE: Basal rot
HOST: Cabbage (Brassica pekinensis)
PATHOGEN: Pectobacterium carotovorum
PATHOGEN SYNONYM: Erwinia carotovora subsp. carotovora
SOURCE: Y. Sakamoto, M. Goto