DISEASE: Bacterial leaf spot
HOST: Rhododendron
Leaf with light brown, irregularly shaped spots.

Bacterial leaf spot | Rhododendron
DISEASE: Bacterial leaf spot
HOST: Rhododendron (Rhododendron catawbiense 'Album')
PATHOGEN: Pseudomonas cichorii
SOURCE: W. Uddin, W. Sinclair
DISEASE: Bacterial wilt
HOST: Heliconia
Wilted and dying heliconia plant.

Bacterial wilt | Heliconia
DISEASE: Bacterial wilt
HOST: Heliconia (Heliconia sp.)
PATHOGEN: Ralstonia solanacearum
PATHOGEN SYNONYM: Pseudomonas solanacearum
SOURCE: I. Buddenhagen
DISEASE: Bacterial wilt
HOST: Heliconia
Heliconia spathes with wilt and leaf necrosis.

Bacterial wilt | Heliconia
DISEASE: Bacterial wilt
HOST: Heliconia (Heliconia sp.)
PATHOGEN: Ralstonia solanacearum
PATHOGEN SYNONYM: Pseudomonas solanacearum
SOURCE: I. Buddenhagen
DISEASE: Bacterial wilt
HOST: Heliconia
Heliconia stalk with discolored base.

Bacterial wilt | Heliconia
DISEASE: Bacterial wilt
HOST: Heliconia (Heliconia sp.)
PATHOGEN: Ralstonia solanacearum
PATHOGEN SYNONYM: Pseudomonas solanacearum
SOURCE: I. Buddenhagen
DISEASE: Bacterial wilt
HOST: Heliconia
Spathe of heliconia infected with bacterial wilt (right) compared with healthy spathe.

Bacterial wilt | Heliconia
DISEASE: Bacterial wilt
HOST: Heliconia (Heliconia sp.)
PATHOGEN: Ralstonia solanacearum
PATHOGEN SYNONYM: Pseudomonas solanacearum
SOURCE: I. Buddenhagen
DISEASE: Brown blotch
HOST: Mushroom
Stunted fruit bodies, initial stage of disease.

Brown blotch | Mushroom
DISEASE: Brown blotch
HOST: Mushroom (Pleurotus ostreatus)
PATHOGEN: Pseudomonas tolaasii
SOURCE: K. Suyama, M. Goto
DISEASE: Brown blotch
HOST: Mushroom
Fruit bodies at advanced stage of disease.

Brown blotch | Mushroom
DISEASE: Brown blotch
HOST: Mushroom (Pleurotus ostreatus)
PATHOGEN: Pseudomonas tolaasii
SOURCE: K. Suyama, M. Goto
DISEASE: Brown blotch
HOST: Mushroom
Black discoloration of basal portions of fruit bodies. Healthy (left).

Brown blotch | Mushroom
DISEASE: Brown blotch
HOST: Mushroom (Flammulina velutipes)
PATHOGEN: Pseudomonas tolaasii
SOURCE: K. Suyama, M. Goto