DISEASE: Bacterial gall
HOST: Carrot
Root with many galls of different sizes.

Bacterial gall | Carrot
DISEASE: Bacterial gall
HOST: Carrot (Daucus carota)
PATHOGEN: Rhizobacter dauci
SOURCE: H. Kuwata
DISEASE: Bacterial gall
HOST: Carrot
Galls caused from inoculation of injured roots (left two) and uninjured roots (center two). Uninjured, noninoculated root (right).

Bacterial gall | Carrot
DISEASE: Bacterial gall
HOST: Carrot (Daucus carota)
PATHOGEN: Rhizobacter dauci
SOURCE: M. Goto
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Dieffenbachia with rot and decay of stem and leaf tissues.

Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: A. Alvarez
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Dieffenbachia with wilted and rotted leaves.

Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: R. Raabe
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Cross section of stem exposing rotted tissues.

Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: R. Raabe
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Leaf with rot and wilt.

Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: R. Raabe
DISEASE: Bacterial wilt and dieback
HOST: Willow
Cross sections of the characteristic "watermark stain" of diseased wood. Wilt and dieback occur as disease progresses.

Bacterial wilt and dieback | Willow
DISEASE: Bacterial wilt and dieback
HOST: Willow (Salix sp.)
PATHOGEN: Brenneria salicis
PATHOGEN SYNONYM: Erwinia salicis
SOURCE: Y. Sakamoto, M. Goto