DISEASE: Bacterial blight
HOST: Hazelnut
Diseased young tree with discoloration of the cambium. Dieback of young twigs and branches is characteristic. Other typical symptoms are bud and twig necrosis and small, angular or round, water-soaked leaf spots.

Bacterial blight | Hazelnut
DISEASE: Bacterial blight
HOST: Hazelnut (Corylus americana)
PATHOGEN: Xanthomonas arboricola pv. corylina
SOURCE: J. Pscheidt
DISEASE: Bacterial blight
HOST: Soybean
Leaves with yellowish brown necrotic lesions. Lesions also may be yellow to light brown and bordered by yellowish green halos. Lesions occur on stems, petioles, and pods.

Bacterial blight | Soybean
DISEASE: Bacterial blight
HOST: Soybean (Glycine max)
PATHOGEN: Pseudomonas syringae pv. glycinea
SOURCE: J. B. Sinclair
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower
Leaves with tiny lesions surrounded by large halos.

Bacterial leaf spot (Head rot) | Cauliflower
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower (Brassica oleracea var. botrytis)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: R. Campbell
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower
Section of a cauliflower head with discolored, infected tissues.

Bacterial leaf spot (Head rot) | Cauliflower
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower (Brassica oleracea var. botrytis)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: R. Campbell
DISEASE: Bacterial leaf spot
HOST: Collard
Leaf with several kinds of spots. Small necrotic lesions with yellow halos, brown lesions, and large, brown necrotic areas caused by coalescing of lesions.

Bacterial leaf spot | Collard
DISEASE: Bacterial leaf spot
HOST: Collard (Brassica oleracea var. acephala)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: S. Miller
DISEASE: Bacterial leaf spot
HOST: Radish
Leaf with brown lesions, some with a water-soaked appearance.

Bacterial leaf spot | Radish
DISEASE: Bacterial leaf spot
HOST: Radish (Raphanus sativus var. longipinnatus)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: J. Togashi, M. Goto