DISEASE: Bacterial leaf spot
HOST: Pumpkin
Leaf with tan to brown, angular lesions with dark margins. They are similar to those caused by angular leaf spot.

Bacterial leaf spot | Pumpkin
DISEASE: Bacterial leaf spot
HOST: Pumpkin (Cucurbita pepo)
PATHOGEN: Xanthomonas cucurbitae
SOURCE: J. Young
DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize)
Wilted, dying plants. Leaves have gray to light yellow stripes and irregular margins that follow leaf veins. Systemically infected plants usually have orange vascular bundles.

Goss's bacterial wilt and blight | Corn (Maize)
DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize) (Zea mays)
PATHOGEN: Clavibacter michiganensis subsp. nebraskensis
PATHOGEN SYNONYM: Corynebacterium nebraskense
SOURCE: A. Vidaver
DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize)
The disease causes necrotic leaf lesions, which typically have dark flecks (freckles) within the lesions (not seen here).

Goss's bacterial wilt and blight | Corn (Maize)
DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize) (Zea mays)
PATHOGEN: Clavibacter michiganensis subsp. nebraskensis
PATHOGEN SYNONYM: Corynebacterium nebraskense
SOURCE: A. Vidaver
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Seedling with rot symptoms.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto