DISEASE: Ear rot
HOST: Corn (Maize)
Rot at apical end of ear.

Ear rot | Corn (Maize)
DISEASE: Ear rot
HOST: Corn (Maize) (Zea mays)
PATHOGEN: Pseudomonas marginalis
SOURCE: L. Fucikovsky
DISEASE: Marginal leaf blight
HOST: Lettuce
Marginal leaf blight first appears as slimy wilting of leaf margins. Small, reddish lesions may be seen on leaf blades. Infected tissues turn brown to black in time.

Marginal leaf blight | Lettuce
DISEASE: Marginal leaf blight
HOST: Lettuce (Lactuca sativa)
PATHOGEN: Pseudomonas marginalis
SOURCE: L. Fucikovsky
DISEASE: Oleander knot
HOST: Oleander
Oleander with small knots/galls on leaf and stems.

Oleander knot | Oleander
DISEASE: Oleander knot
HOST: Oleander (Nerium oleander)
PATHOGEN: Pseudomonas savastanoi pv. nerii
SOURCE: W. Sinclair
DISEASE: Oleander knot
HOST: Oleander
Young stem with knots/galls.

Oleander knot | Oleander
DISEASE: Oleander knot
HOST: Oleander (Nerium oleander)
PATHOGEN: Pseudomonas savastanoi pv. nerii
SOURCE: R. Raabe
DISEASE: Oleander knot
HOST: Oleander
Leaf with early stage of knot/gall formation.

Oleander knot | Oleander
DISEASE: Oleander knot
HOST: Oleander (Nerium oleander)
PATHOGEN: Pseudomonas savastanoi pv. nerii
SOURCE: R. Raabe
DISEASE: Oleander knot
HOST: Oleander
Infected flowers with small knots/galls and necroses.

Oleander knot | Oleander
DISEASE: Oleander knot
HOST: Oleander (Nerium oleander)
PATHOGEN: Pseudomonas savastanoi pv. nerii
SOURCE: W. Sinclair
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.

Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto