DISEASE: Bacterial blight
HOST: Soybean
Leaves with yellowish brown necrotic lesions. Lesions also may be yellow to light brown and bordered by yellowish green halos. Lesions occur on stems, petioles, and pods.

Bacterial blight | Soybean
DISEASE: Bacterial blight
HOST: Soybean (Glycine max)
PATHOGEN: Pseudomonas syringae pv. glycinea
SOURCE: J. B. Sinclair
DISEASE: Bacterial hyperplastic canker
HOST: Almond
Diseased tree with multiple cankers. Margins of cankers are rough, soft, cheesy, dark brown, and have scalloped water-soaked spots that turn brown. Multiple cankers may girdle and kill small twigs.

Bacterial hyperplastic canker | Almond
DISEASE: Bacterial hyperplastic canker
HOST: Almond (Prunus dulcis)
PATHOGEN: Pseudomonas amygdali
SOURCE: P. Psallidas
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower
Leaves with tiny lesions surrounded by large halos.

Bacterial leaf spot (Head rot) | Cauliflower
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower (Brassica oleracea var. botrytis)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: R. Campbell
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower
Section of a cauliflower head with discolored, infected tissues.

Bacterial leaf spot (Head rot) | Cauliflower
DISEASE: Bacterial leaf spot (Head rot)
HOST: Cauliflower (Brassica oleracea var. botrytis)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: R. Campbell
DISEASE: Bacterial leaf spot
HOST: Collard
Leaf with several kinds of spots. Small necrotic lesions with yellow halos, brown lesions, and large, brown necrotic areas caused by coalescing of lesions.

Bacterial leaf spot | Collard
DISEASE: Bacterial leaf spot
HOST: Collard (Brassica oleracea var. acephala)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: S. Miller
DISEASE: Bacterial leaf spot
HOST: Radish
Leaf with brown lesions, some with a water-soaked appearance.

Bacterial leaf spot | Radish
DISEASE: Bacterial leaf spot
HOST: Radish (Raphanus sativus var. longipinnatus)
PATHOGEN: Pseudomonas syringae pv. maculicola
SOURCE: J. Togashi, M. Goto