DISEASE: Bacterial dieback of peach
HOST: Peach
Dark cankers on last year's twig. This leads to blighting of buds the following year.
Bacterial dieback of peach | Peach
DISEASE: Bacterial dieback of peach
HOST: Peach (Prunus persica)
PATHOGEN: Pseudomonas syringae pv. persicae
SOURCE: J. Young
DISEASE: Bacterial palea browning
HOST: Rice
Early stage of disease with browning of palea.
Bacterial palea browning | Rice
DISEASE: Bacterial palea browning
HOST: Rice (Oryza sativa)
PATHOGEN: Pantoea agglomerans
PATHOGEN SYNONYM: Erwinia herbicola
SOURCE: K. Ozaki, M. Goto
DISEASE: Bacterial palea browning
HOST: Rice
Browning of palea begins with water-soaked lesions that later turn dark brown. Infected grains become brown after milling.
Bacterial palea browning | Rice
DISEASE: Bacterial palea browning
HOST: Rice (Oryza sativa)
PATHOGEN: Pantoea agglomerans
PATHOGEN SYNONYM: Erwinia herbicola
SOURCE: T. Mew
DISEASE: Sheath brown rot
HOST: Rice
Disease symptoms typically occur on flag leaf sheaths from booting to heading stage and also on panicles. Water-soaked lesions on glumes turn light brown.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Close-up of stem lesions.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Seedling with rot symptoms.
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto
DISEASE: Sheath brown rot
HOST: Rice
Diseased, unhulled grains with brown discoloration. Healthy grain (left).
Sheath brown rot | Rice
DISEASE: Sheath brown rot
HOST: Rice (Oryza sativa)
PATHOGEN: Burkholderia fuscovaginae
PATHOGEN SYNONYM: Pseudomonas fuscovaginae
SOURCE: K. Miyajima, M. Goto